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Introduction to Semiconductor Device Yield Modeling

Introduction to Semiconductor Device Yield Modeling

Copyright: 1992
Pages: 104
ISBN: 9780890064504

Artech House is pleased to offer you this title in a special In-Print-Forever® ( IPF® ) hardbound edition. This book is not available from inventory but can be printed at your request and delivered within 2-4 weeks of receipt of order. Please note that because IPF® books are printed on demand, returns cannot be accepted.


Print Book $93.00 Qty:
This book addresses the economic need for accurate yield prediction and clarifies the important role it plays in the semiconductor industry. With it, you 'll be better prepared to make accurate yield predictions to produce more reliable and cost-effective devices. The book is supported by over 225 equations, 18 figures, and 64 references.
Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.
  • Albert V. Ferris-Prabhu
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