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Reliability and Degradation of III-V Optical Devices

Reliability and Degradation of III-V Optical Devices

By (author): Osamu Ueda
Copyright: 1996
Pages: 353
ISBN: 9780890066522

Artech House is pleased to offer you this title in a special In-Print-Forever® ( IPF® ) hardbound edition. This book is not available from inventory but can be printed at your request and delivered within 2-4 weeks of receipt of order. Please note that because IPF® books are printed on demand, returns cannot be accepted.


Print Book $149.00 Qty:
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation, and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Introduction. Materials and Structures of Optical Devices. Crystal Growth. Fabrication Processes of Optical Devices. Device Characteristics and Life Testing. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors (1) - Defect Generation. Materials Issues in III-V Compound Semiconductors (2) - Thermal Stability of III-V Alloy Semiconductors. Classification of Degradation Modes and Degradation Phenomena in Optical Devices. Degradation (1) - Rapid Degradation. Degradation (2) - Gradual Degradation. Degradation (3) - Catastrophic Failure.
  • Osamu Ueda
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