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This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.
Table Of Contents
Introduction to Current Testing. Test Generation for Iddq Testing. Manufacturability and Use in Production. Current Testing Techniques. Case Studies With Iddq Testing. Summary and Suggestions.