Introduction to Semiconductor Device Yield Modeling

Introduction to Semiconductor Device Yield Modeling

Copyright: 1992
 Pages: 104
 ISBN: 9780890064504

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Description
This book addresses the economic need for accurate yield prediction and clarifies the important role it plays in the semiconductor industry. With it, you 'll be better prepared to make accurate yield predictions to produce more reliable and cost-effective devices. The book is supported by over 225 equations, 18 figures, and 64 references.
Table Of Contents
Yield. Fault Probability. Effect of Defect Sizes on the Fault Probability. Counting Techniques. Yield Equations. Defect Density and Scaling Rules. Yield Prediction. Yield With Redundancy. A Yield Comparison. Productivity. Conclusion. References.

Author

  • Albert V. Ferris-Prabhu