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Let twelve specialists show you how to test, analyze, and achieve better microelectronic reliability of silicon and GaAs devices. Microelectronic Reliability, Volume I: Reliability, Test, and Diagnostics offers you detailed, original works on the topics most vital to both device and equipment reliability and manufacturing yield. Broad enough to serve as an effective textbook and in-depth enough for practicing engineers, this text also makes an ideal reference for managers who need a quick overview of current reliability, test, and failure analysis issues. Supported by 600 references, 147 figures, and 39 tables, this encyclopedic guide shows you how to identify the thermal, chemical, and mechanical processes that influence the incidence and severity of failure mechanisms. This coverage outlines techniques for assessing the susceptibility to failure of various devices. Detailing the theory and operation of current failure analysis tools, the text also gives you instrument price ranges and example analyses. Combined with the sweeping overview and comprehensive bibliography found in Microelectronic Reliability Volume II, this text gives you the only source you need to meet today's ever-improving standards for quality and reliability of advanced microelectronic technology.
Table Of Contents
Preface.Introduction. Statistical Aspects for Reliability. Failure Mechanisms in Microelectronic Devices. Testability for Functional Verification and Diagnostics. Automatic Testing. Manufacturing Process Control. GaAs Reliability and Test. Appendix A: Advanced Failure Analysis Instrumentation. List of Acronyms. Glossary. Index.