By (author): Emiliano Pollino

Copyright: 1989
Pages: 554
ISBN: 9780890063507

Artech House is pleased to offer you this title in a special In-Print-Forever® ( IPF® ) hardbound edition. This book is not available from inventory but can be printed at your request and delivered within 2-4 weeks of receipt of order. Please note that because IPF® books are printed on demand, returns cannot be accepted.

Our Price: $146.00

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up.
Table Of Contents
The Technological Revolution and Reliability. Basics of Semiconductor Device Technology. Corrosion of Metalization. Electromigration in Thin Film Conductors. Metal-Silicon Interactions. Latch-Up in CMOS Integrated Circuits. Reliability of Compound Semiconductor Microwave Field Effect Devices. Reliability of Optoelectronic Components. Power Device Reliability. Accelerated Tests. Microanalysis Techniques. Failure Analysis and Technological Characterization. Reliability Problems and Standards.


  • Emiliano Pollino