On-Wafer Microwave Measurements and De-embedding

The focus of his book is the complex subject of on-wafer measurements and their associated characterization techniques. Dr. Lourandakis aims to bridge the gap between academic knowledge and real-world silicon design and measurement and thus satisfy the needs of modern-day RF integrated circuit designers and researchers. His purpose is to provide a complete and comprehensive guide for performing on-wafer measurements, calibration, and de-embedding of silicon-integrated passive devices. On-Wafer Microwave Measurements and De-Embedding offers a solid theoretical foundation along with real-world practical guidance in on-wafer CMOS passive component measurements for lab professional and researchers. It can also provide newcomers with an excellent head start.

On-Wafer RF measurements are central to the RF/microwave semiconductor industry, from model development to IC design and, in many cases, IC production. "On-Wafer Microwave Measurements and De-embedding" is a comprehensive treatment of making on-wafer measurements and processing the raw data to extract device performance from the measurement artifacts. Written for "hands on" engineers the information is concise and practical.

Dr. Lourandakis demystifies the art of on-wafer measurements by offering a solid theoretical foundation along with a wealth of practical guidelines to help researchers and lab professionals characterize silicon devices for numerous high-speed applications ranging from 5G RFICs, to automotive radars, to multi-Gbps SoCs.

This book provides an excellent narrative for those engineers wishing to understand on-wafer calibration techniques from the absolute basics up to an advanced level. The early chapters build up from the operation of the vector network analyser and the basics of calibration steadily advancing to on-wafer calibration algorithms such as TRL and LRM and de-embedding routines. Finally their application in DUT measurements for active and passives on silicon are covered but much of this transposes to other substrates including GaAs. This is certainly a book I would recommend to my students as a primer for on-wafer device measurement and as a prelude to parameter extraction and device modelling.

On-Wafer Microwave Measurements and De-embedding offers its readers a complete understanding of on-wafer vectorial network analyzer measurement techniques. Errikos Lourandakis presents a clear, precise, and elegant document to master all the techniques related to on-wafer vectorial network measurements. The author is testifying a great pedagogy by numerous concrete examples making this book an important supplement in educating RF and microwave engineers. Any engineer desiring to work with a microwave/ RF probe station should own this book.