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By (author): Osamu Ueda

Copyright: 1996
Pages: 353
ISBN: 9780890066522

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Description
In developing III-V optical devices for use in optical fiber communication systems, digital-audio systems, and optical printers, reliability is paramount. This unique book focuses specifically on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing better understand the mechanism of degradation, and details the major degradation modes of optical devices fabricated from three different systems. The book explains the character of defects and imperfections induced during material growth and fabrication, presents techniques for failure analysis, and describes methods for elimination of defect-generating mechanisms. More than 200 illustrations and 40 equations help clarify important concepts.
Table Of Contents
Introduction. Materials and Structures of Optical Devices. Crystal Growth. Fabrication Processes of Optical Devices. Device Characteristics and Life Testing. Evaluation Techniques for III-V Compound Semiconductors and Degraded Optical Devices. Materials Issues in III-V Compound Semiconductors (1) - Defect Generation. Materials Issues in III-V Compound Semiconductors (2) - Thermal Stability of III-V Alloy Semiconductors. Classification of Degradation Modes and Degradation Phenomena in Optical Devices. Degradation (1) - Rapid Degradation. Degradation (2) - Gradual Degradation. Degradation (3) - Catastrophic Failure.

Author

  • Osamu Ueda