Copyright: 2010
Pages: 270
ISBN: 9781596932722

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Description
This practical resource offers you detailed guidance on the impact of substrate noise on a wide range of circuits operating from baseband frequencies up to mm-wave frequencies. This unique book presents case studies to illustrate that careful modeling of the assembly characteristics and layout details is required to bring simulations and measurements into agreement. You learn how to use a proper combination of isolation structures and circuit techniques to make analog/RF circuits more immune to substrate noise.
Table Of Contents
Introduction -Introduction and Motivation. Book overview.; Substrate Noise Propagation -Introduction. Modeling the Substrate. The Substrate Modeled with FDM. The Substrate as a Finite Element Model. Conclusions. ; Passive Isolation Structures -Introduction. Overview and Description of the Different Types of Passive Isolation Structures. Prediction and Understanding of Guard Rings. Design of an Eff cient P+ Guard Ring. Conclusions. ; Noise Coupling in Active Devices -Introduction. Substrate Noise Impact on Analog Design. Impact Simulation Methodology. Transistor Test Bench. Substrate Noise Coupling Mechanisms in a Transistor. Conclusions.; Measuring the Coupling Mechanisms in Analog/RF Circuits -Introduction. Measurement-Based Identification of the Dominant Substrate Noise Coupling Mechanisms. Example: 900 MHz LC-VCO. Study of the Coupling Mechanisms Between a Power Amplifier and an LC-VCO. Conclusions.; The Prediction of the Impact of Substrate Noise on Analog/RF Circuits -Introduction. The Substrate Modeled with FDM. Substrate Modeled by the FEM Method. Techniques to Reduce Substrate Noise Coupling. Conclusions.; Noise Coupling in Analog/RF Systems -Introduction. Impact Simulation Methodology. Analyzing the Impact of Substrate Noise in Analog/RF Systems. Substrate Noise Impact on a 48-53 GHz LC-VCO. Impact of Substrate Noise on a DC to 5 GHz Wideband Receiver. Conclusions and Discussion.; Appendices. List of Acronyms. About the Authors. Index.;

Author

  • Stephane Bronckers Stephane Bronckers is a research assistant in the Department of Fundamental Electricity and Instrumentation at the Vrije Universiteit Brussels. He holds an M.S. in electrical engineering from that same university.
  • Geert Van Der Plas Geert Van der Plas is a principal scientist at the Interuniversity Microelectronics Center (IMEC) in Belgium. He received his M.Sc. and Ph.D. from the Katholieke Universiteit Leuven, Belgium.