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Frequency-Domain Characterization of Power Distribution Networks

Frequency-Domain Characterization of Power Distribution Networks

By (author)s: Jason R. Miller, Istvan Novak
Copyright: 2007
Pages: 360
ISBN: 9781596932012

Measure, simulate, and model power distribution networks (PDNs) accurately and efficiently with this new, cutting-edge resource. Frequency-domain analysis has revolutionized component design, and this book shows you, step-by-step, how to accurately characterize PDN components in the frequency domain including vias, bypass capacitors, planes, DC-DC converters and systems. Guiding you through the many alternatives to characterizing PDNs, it helps you to improve accuracy by choosing the right technique and avoiding the common pitfalls. Practical examples point out the strengths and weaknesses of simulation tools as well as explain setting parameters and options. The book presents best practices for measuring that aid you in the selection of calibration processes, instruments, probes, and cables. You learn how to use frequency-domain simulations and measurements to model printed-circuit board elements, including vias, planes, bypass capacitors, inductors, and DC-DC converters. Over 300 illustrations and more than 150 equations support key topics throughout the book.
IntroductionEvolution of Power Distribution Networks. The Importance of Frequency Domain. The Impedance Matrix. When Time-Domain Characterization Is Useful. If and When Time-Domain Response Is Needed. The Characterization Process. The Modeling Process. Simulation Methods and ToolsSpreadsheet Calculations. SPICE AC. MATLAB. Field Solvers. Characterizing and Modeling ViasVia Partial Inductance. Via Loop Inductance. Via Arrays. Characterizing and Modeling Planes and LaminatesAnalytic Plane Models. Transmission-Line Models. Effect of Plane Parameters on Self- and Transfer Impedances. Characterization of Plane and Laminate Parameters. Impedance Measurement BasicsSelecting the Measurement Concept for PDN Impedance. The Importance of Two-Port Connections. Self and Transfer Impedance. Transforming Measured S Parameters. Extracting Component Parameters from Measured Data. Connections and CalibrationsPort Connections. Probes, Connectors, and Cables. Calibrations. Stability and Accuracy of Measurements. Measurement: Practical DetailsMaking the Proper Connections. Making the Proper Measurements. System Measurements. Characterization and Modeling of Bypass CapacitorsSimple C-R-L Models and Spreadsheet Correlations. Wideband Characterization. Impact of Geometry on Electrical Parameters. Effect of Other Variables on Capacitor Parameters. Multicomponent C-R-L Models. Black-Box Model. Bedspring Capacitor Model. Causal Slow-Wave Model. Characterization and Modeling of Inductors, DC-DC Converters, and Systems -Characterization and Modeling of Inductors. Characterization and Modeling of Power Coverters. Modeling and Characterizing Systems. About the Authors. Index.
  • Jason R. Miller Jason R. Miller is a senior staff engineer at Sun Microsystems. He attended Columbia University where he received his M.S. and Ph.D. in electrical engineering.
  • Istvan Novak

    is a distinguished engineer at Sun Microsystems. A fellow of the IEEE, he holds an M.S. in electrical engineering from the Technical University of Budapest and a Ph.D. in precision electrical measurements from the Hungarian Academy of Sciences. Dr. Novák has been a member of the Continuing Education Institute-Europe Faculty since 1992.

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