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Artech House USA
The VNA Applications Handbook

The VNA Applications Handbook

Copyright: 2019
Pages: 400
ISBN: 9781630816001

Hardback $152.00 Qty:
Digital download and online $144.00 Qty:

Written by prominent experts in the field, this authoritative new resource provides guidelines for performing a wide variety of Vector Network Analyzers (VNA) measurements. The capabilities and limitations of modern VNA in the context of challenging real-world applications are explained, as well as insights for optimizing test setups and instrument settings, making accurate measurements and, equally important, avoiding costly mistakes.


Organized by topic, the readers can focus on chapters covering particular measurement challenges. Application topics include linear and non-linear measurements of passive and active devices, frequency converting devices, and special considerations for high-power, high-gain, and pulsed devices. Signal Integrity and time-domain reflectometry are covered, as well as emerging applications at millimeter-wave frequencies driven by 5G and automotive radar. Waveguide is presented, with emphasis on understanding guided-wave propagation and the associated calculations required for creating calibration standards. Each application is supported by illustrations that help explain key concepts and VNA screenshots are used to show both expected and, in some cases, unexpected results. This book equips engineers and lab technicians to better understand these important instruments, and effectively use them to develop the technologies that drive our world.

Architecture of the Modern VNA; Calibration Techniques; Cable, Adapter and Attenuator Measurements; Filter, Transformer, Coupler, Circulator Measurements; Amplifier Measurements; Measurements on Mixers and Frequency Converters; Pulse Measurements; Antenna Measurements; Waveguide an d Millimeter-Wave Measurements; Measurements on a Probe Station.

  • Gregory Bonaguide

    is a Senior Product Line Engineer for Rohde & Schwarz, specializing in Spectrum Analyzers and Vector Network Analyzers. He holds an MSEE from the University of South Florida. He has published papers in dozens of journals and has authored and delivered presentations at past IEEE-MTT conferences. He is a senior member of IEEE.

  • Neil Jarvis

    is an applications engineer at Rohde and Schwarz. He received his MS in technology management from Pepperdine University in Technology Management and a BSEE from San Jose State University in Engineering. He holds multiple patents in RF and Microwave.

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