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Hubert Werkmann is a principal consultant at Verigy Germany GmbH. He has over 20 years of experience in the semiconductor design and test industry with various positions at IMS Chips, Agilent Technologies, and Verigy. Dr. Werkmann has multiple published papers in the areas of scan-based design for testability and ATE high-speed testing of computation and memory devices. Dr. Werkmann received a Diploma degree in computer science and a Ph.D. in engineering from the University of Stuttgart, Germany.
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