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Sudarshan Bahukudumbi

Sudarshan Bahukudumbi is a quality and reliability test engineer at Intel Corporation. He has written several articles in peer-reviewed journals and is a frequent presenter at industry conferences. He holds an M.S. and Ph.D. in electrical engineering from New Mexico University and Duke University, respectively.

Sudarshan Bahukudumbi's Books

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Wafer-Level Testing and Test During Burn-In for Integrated Circuits

By (author): Sudarshan Bahukudumbi
Published: 02/28/2010
ISBN: 9781596939905

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Sudarshan Bahukudumbi

Sudarshan Bahukudumbi's Books